PaperComment on "Misfit stress in InGaAs/InP heteroepitaxial structures grown by vapor-phase epitaxy" (Journal of Applied Physics (1985) 57 (249))I.C. Noyan, Armin SegmüllerJournal of Applied Physics
PaperX-ray diffraction studies of thin films and multilayer structuresArmin Segmüller, I.C. Noyan, et al.Progress In Crystal Growth And Characterization
PaperCharacterization of epitaxial films by grazing-incidence X-ray diffractionArmin SegmüllerThin Solid Films
PaperDiluted magnetic semiconductor superlattices for magnetic studies of dimensional crossover (invited)J.M. Hong, D.D. Awschalom, et al.Journal of Applied Physics
