Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Paper

02 Jun 2014

Zur Röntgen-Fluoreszenz-Analyse dünner Legierungsschichten

Abstract

No abstract available.

Paper

Smooth and coherent layers of GaAs and AlAs grown by molecular beam epitaxy

L.L. Chang, Armin Segmüller, et al.

Applied Physics Letters

Paper

Growth of epitaxial films of CdTe and (Cd,Mn)Te on GaAs substrates

T. Siegrist, Armin Segmüller, et al.

Applied Physics Letters

Paper

Automatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patterns

Armin Segmüller, J. Angilelo, et al.

Journal of Applied Physics

Paper

Characterization of epitaxial films by grazing-incidence X-ray diffraction

Armin Segmüller

Thin Solid Films

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