PaperIn Situ Surface X-ray Scattering Measurements of Electrochemically Deposited Bi on Ag(111): Structure, Compressibility, and Comparison with ex Situ Low-Energy Electron Diffraction MeasurementsMichael F. Toney, Joseph G. Gordon, et al.Langmuir
PaperX-ray depth profiling of iron oxide thin filmsMichael F. Toney, Ting C. Huang, et al.Journal of Materials Research
PaperNear-surface alignment of polymers in rubbed filmsMichael F. Toney, Thomas P. Russell, et al.Nature
PaperAtomic structure of the passive oxide film formed on ironMichael F. Toney, Alison J. Davenport, et al.Physical Review Letters
