E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
We report photoemission measurements of valence band critical points, core level binding energies and spin-orbit splittings, and Auger processes using synchrotron radiation in the 20-70 eV range for InSb. Based on our studies of InSb and other semiconductors, several precautions when interpreting photoemission data in this energy range (e.g. Auger processes, matrix elements) are discussed. © 1973.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
A. Krol, C.J. Sher, et al.
Surface Science
R. Ghez, J.S. Lew
Journal of Crystal Growth
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics