F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
We report photoemission measurements of valence band critical points, core level binding energies and spin-orbit splittings, and Auger processes using synchrotron radiation in the 20-70 eV range for InSb. Based on our studies of InSb and other semiconductors, several precautions when interpreting photoemission data in this energy range (e.g. Auger processes, matrix elements) are discussed. © 1973.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
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