Avi Ziv, Jehoshua Bruck
IEEE TC
Coverage Directed Generation represents algorithms that are used to create tests or test-templates for hitting coverage events. Standard approaches for solving the problem use either user's intuition or random sampling. Recent work has been using optimization algorithms in order to hit, a single hard-to-hit event. In this work we extend the optimization technique for many events and show that by using a deep neural network one can accelerate the optimization significantly. The algorithms are presented on the NorthStar simulator where we show substantial improvement over random based techniques and a factor larger than 2 on other optimization-based techniques.
Avi Ziv, Jehoshua Bruck
IEEE TC
Raviv Gal, Giora Simchoni, et al.
MLCAD 2020
Eldad Haber, Brian Irwin, et al.
ICML 2023
Raviv Gal, Haim Kermany, et al.
DAC 2020