Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
T. Graham, A. Afzali, et al.
Microlithography 2000
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007