Conference paper
Nanoscale resistive memory device using SrTiO3 films
S. Karg, G.I. Meijer, et al.
NVSMW 2007
The emission characteristics of top-emitting light-emitting devices (OLED) were studied to investigate the effect of a dielectric capping layer. With the capping-layer concept, the outcoupled light intensity in forward direction was increased by a factor of 1.7. The emission characteristics were calculated using an optical model.
S. Karg, G.I. Meijer, et al.
NVSMW 2007
W. Brütting, H. Riel, et al.
Journal of Applied Physics
S. Karg, J.C. Scott, et al.
Synthetic Metals
H. Ghoneim, J. Knoch, et al.
ULIS 2009