Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The emerging trends in photoresists and advanced patterning materials are described, including functional fluoropolymers, molecular glasses, and imprint resists. ©2007TAPJ.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Lawrence Suchow, Norman R. Stemple
JES
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021