Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The emerging trends in photoresists and advanced patterning materials are described, including functional fluoropolymers, molecular glasses, and imprint resists. ©2007TAPJ.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
R. Ghez, J.S. Lew
Journal of Crystal Growth