Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A new lower bound for the mean code length of all one-to-one codes for a random variable with n outcomes is derived. The bound, which is tight, improves an earlier one due to Leung-Yan-Cheong and Cover. Another bound for one-to-one codes for binary information sources is derived. ©1982 IEEE
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Sai Zeng, Angran Xiao, et al.
CAD Computer Aided Design
Rajiv Ramaswami, Kumar N. Sivarajan
IEEE/ACM Transactions on Networking