Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
We present a brief introduction to three reliability engineering techniques: failure mode, effects, and criticality analysis; reliability block diagrams; and fault tree analysis. We demonstrate the use of one of these techniques, reliability block diagrams, in evaluating the availability of information technology (IT) systems through a case study involving an IT system supported by a three-tier Web-server configuration. © Copyright 2008 by International Business Machines Corporation.
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
B. Wagle
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IEEE Communications Magazine
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CoNEXT 2006