Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
We explore the thickness-dependent optical properties of single layer polymer light emitting diodes for two materials, poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylene-ethenylene-2,5-dioctyloxy-1,4-phenylene-ethenylene] (MEH-DOO-PPV) and poly(2,7-(9,9-bis(2-ethylhexyl))fluorene)-2,7-bis(4-methylphenyl)phenylamine (PF with 2% endcap). We compare experimental electroluminescence spectra and radiance values as a function of emissive layer thickness with simulations utilizing dipole methods within a transfer-matrix formalism. The technique is then extended to explore how simulated results depend on the assumed location of emission within the polymer layer. We show that thickness-dependent optical properties of these devices are dominated by interference effects. © 2003 The American Physical Society.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering