Hai Li, Chen-Yong Cher, et al.
IEEE Transactions on VLSI Systems
Power-related issues have become important considerations in current generation microprocessor design. One of these issues is that of elevated on-chip temperatures. This has an adverse effect on cooling cost and, if not addressed suitably, on chip reliability. In this paper we investigate the general trade-offs between temporal and spatial hot spot mitigation schemes and thermal time constants, workload variations and microprocessor power distributions. By leveraging spatial and temporal heat slacks, our schemes enable lowering of on-chip unit temperatures by changing the workload in a timely manner with Operating System(OS) and existing hardware support. Copyright 2007 ACM.
Hai Li, Chen-Yong Cher, et al.
IEEE Transactions on VLSI Systems
Yefim Shuf, Manish Gupta, et al.
ACM SIGPLAN Notices
Hubertus Franke, Jimi Xenidis, et al.
IBM J. Res. Dev
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PACT 2010