John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
John A. Hoffnagle, William D. Hinsberg, et al.
Microlithography 2003
Martin Charles Golumbic, Renu C. Laskar
Discrete Applied Mathematics
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007