Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
A very simple derivation is given of the ionization probability P − for negative ions sputtered off a metal surface. The result P −≈e−(ϕ−A)/cv⊥ shows the experimentally observed dependences on work function ϕ, atomic affinity A, and outwards velocity v ⊥. Estimates of c show good agreement with experiment, too. The physical picture behind the process is discussed. © 1983 IOP Publishing Ltd.
T.N. Morgan
Semiconductor Science and Technology
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
T. Schneider, E. Stoll
Physical Review B
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures