John M. Boyer, Charles F. Wiecha
DocEng 2009
In this presentation, the scaling challenges facing current Complimentary Metal Oxide Semiconductor (CMOS) technology will be discussed, along with the ultimate limits for charge-switching based devices. From this motivation, the current status of the Nanoelectronics Research Initiative (NRI) will be discussed, with an overview of the current research topics being investigated at the NRI centers. Copyright 2009 ACM.
John M. Boyer, Charles F. Wiecha
DocEng 2009
Fan Zhang, Junwei Cao, et al.
IEEE TETC
Rajeev Gupta, Shourya Roy, et al.
ICAC 2006
David S. Kung
DAC 1998