J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Using time-resolved luminescence we measure the energy relaxation of excitons in thin quantum wells. We find that the excitons relax by losing potential energy in a drift-diffusion motion driven by potential fluctuations in the quantum well plane, which are longer than the coherence length of the excitons. For a constant interface quality the coherence length strongly decreases with decreasing well width so that drift-diffusion dominates the exciton relaxation in thin quantum wells. © 1992.
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J.Z. Sun
Journal of Applied Physics
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009