Conference paper
Copper contact metallization for 22 nm and beyond
Soon-Cheon Seo, Chih-Chao Yang, et al.
IITC 2009
There is no consensus on the basic physical mechanism of Negative Bias Temperature Instability, in spite of thousands of publications over the past half century. There remains fundamental disagreement over whether NBTI is diffusion-limited or reaction-limited. The origins of the two viewpoints are summarized and some comments on the main controversial aspects of the two leading models are offered.
Soon-Cheon Seo, Chih-Chao Yang, et al.
IITC 2009
Miaomiao Wang, X. Miao, et al.
ASICON 2017
C. Zhou, Keith A. Jenkins, et al.
IRPS 2018
Baozhen Li, Andrew Kim, et al.
IRPS 2018