Sung Ho Kim, Oun-Ho Park, et al.
Small
It is known that the width of the memory loop of the brightness-voltage characteristic in ZnS a-c thin film electroluminescence devices depends on the Mn doping concentration and on the ZnS film thickness. In this study we have varied the ZnS thickness fraction doped with Mn and its location. The results of this study show that the memory loop widens incrementally with the ZnS thickness fraction doped with Mn. We infer that the Mn doping is affecting the high-field bulk conductivity of the ZnS. © 1980, The Electrochemical Society, Inc. All rights reserved.
Sung Ho Kim, Oun-Ho Park, et al.
Small
K.A. Chao
Physical Review B
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992