Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
New data and LEED (low-energy electron diffraction) intensity analysis have led to a new structure for Si{001} 2 × 1 which gives very satisfactory agreement with the data; the fit to experiment is substantially better than for any previous structure. The structure has a dimer bond length of 2.54 Å, an average contraction of the first layer spacing of 8%, three kinds of asymmetric displacements of the two dimer atoms, and differs substantially from all other recently proposed structures. © 1982.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
R. Ghez, M.B. Small
JES