PaperDislocation-source shutdown and the plastic behavior of single-crystal micropillarsH. Tang, K.W. Schwarz, et al.Physical Review Letters
PaperDislocation modeling for the microelectronics industryK.W. Schwarz, D. ChidambarraoMaterials Science and Engineering: A
PaperDislocation dynamics near film edges and corners in siliconK.W. Schwarz, D. ChidambarraoJournal of Applied Physics
PaperEffect of surface roughness on the critical velocities of superfluid He4K.W. SchwarzPhysical Review Letters
