PaperDislocation dynamics near film edges and corners in siliconK.W. Schwarz, D. ChidambarraoJournal of Applied Physics
PaperEffect of surface roughness on the critical velocities of superfluid He4K.W. SchwarzPhysical Review Letters
PaperCombined dislocation and process modeling for local oxidation of silicon structureD. Chidambarrao, X.H. Liu, et al.Journal of Applied Physics
