M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Two techniques for determining threshold are compared to capatitance date. Errors from using 77 K thresholds are determined and the effect on measurements on NA+ doped samples estimated. © 1980, All rights reserved.
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
T.N. Morgan
Semiconductor Science and Technology
Ming L. Yu
Physical Review B
Michiel Sprik
Journal of Physics Condensed Matter