R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Two techniques for determining threshold are compared to capatitance date. Errors from using 77 K thresholds are determined and the effect on measurements on NA+ doped samples estimated. © 1980, All rights reserved.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
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SPIE Advances in Semiconductors and Superconductors 1990
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