J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Two techniques for determining threshold are compared to capatitance date. Errors from using 77 K thresholds are determined and the effect on measurements on NA+ doped samples estimated. © 1980, All rights reserved.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
J.Z. Sun
Journal of Applied Physics
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992