Nature Materials

Paper

01 Jan 2003

Surface diffusion atoms go underground

View publication

Abstract

No abstract available.

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

Electron and positron channeling radiation from beryllium oxide

H.D. Dulman, R.H. Pantell, et al.

Physical Review B

Paper

Effects of mask materials on near field optical nanolithography

Sharee J. McNab, Richard J. Blaikie

Materials Research Society Symposium - Proceedings

Paper

Application of block-copolymer supramolecular assembly for the fabrication of complex TiO₂ nanostructures

Sung Ho Kim, Oun-Ho Park, et al.

Small

View all publications