Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
High-resolution photoemission studies show that about two surface layers of mixed-valent YbAl2 are divalent. These layers exhibit large surface core-level shifts of Δs1=0.92 eV for the topmost and Δs2=0.35 eV for an underlying surface layer, allowing a separation of the divalent part of the spectrum into bulk and surface contributions. In this way, a mean valence of 2.4±0.1 can be derived for bulk YbAl2. The observed Δs1/Δs2 ratio is consistent with a recent theoretical prediction. © 1982.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
John G. Long, Peter C. Searson, et al.
JES
Lawrence Suchow, Norman R. Stemple
JES