Conference paper1Mb 0.41 μm2 2T-2R cell nonvolatile TCAM with two-bit encoding and clocked self-referenced sensingJing Li, Robert Montoye, et al.VLSI Circuits 2013
Conference paperA novel integrated reliability test system for BEOL TDDB studyJifeng Chen, Peilin Song, et al.ISTFA 2012
Conference paperTransmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch upAlan Weger, Steven Voldman, et al.IRPS 2003
Conference paperTransmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchupAlan Weger, Steven Voldman, et al.IRPS 2003