Electronic Device Failure Analysis

Paper

01 Nov 2016

Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS

Conference paper

Mapping systematic and random process variations using light emission from off-state leakage

Franco Stellari, Peilin Song, et al.

IRPS 2009

Conference paper

Counterfeit IC detection using light emission

Peilin Song, Franco Stellari, et al.

IEEE ITC 2014

Conference paper

On-chip power supply noise measurement using time resolved emission (TRE) waveforms of light emission from off-state leakage current (LEOSLC)

Franco Stellari, Peilin Song, et al.

IEEE ITC 2009

Paper

Mapping and statistical analysis of filaments locations in amorphous HfO₂ ReRAM cells

Franco Stellari, Ernest Y. Wu, et al.

Microelectronics Reliability

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