K.A. Chao
Physical Review B
Paper
Summary Abstract: Atomic force microscopy studies of frictional forces and of force effects in scanning tunneling microscopy
Abstract
No abstract available.
Related
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Robert W. Keyes
Physical Review B