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No abstract available.
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
M.B. Small, R.M. Potemski
Proceedings of SPIE 1989
Matthew A Grayson
Journal of Complexity
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009