Noshir B. Dubash, Yongming Zhang, et al.
IEEE TAS
Interface phenomena play a vital role in thermoelectric (TE) microrefrigerators. The present study employs a phenomenological model to examine the behavior of TE refrigerators as a function of thermal and electrical contact resistance, boundary Seebeck coefficient, and heat sink conductance. We modify the conventional definition of the figure of merit to capture the interface effects. A finite temperature drop across the interface between a metal electrode and a thermoelement is found to strongly influence the boundary Seebeck effect. Interface engineering can potentially improve the overall performance of TE microrefrigerators. © 2000 American Institute of Physics.
Noshir B. Dubash, Yongming Zhang, et al.
IEEE TAS
Y. Sungtaek Ju, Ren Xu, et al.
IEEE Transactions on Magnetics
Y. Sungtaek Ju, Wen Y. Lee, et al.
IEEE Transactions on Magnetics
Ho-Ki Lyeo, C. K. Ken Shih, et al.
IMECE 2002