M. Copel, R.J. Culbertson, et al.
Applied Physics Letters
The structure of the Si(111)-CaF2 interface has been determined with medium-energy ion scattering. Ca bonds to the Si substrate in a geometric arrangement virtually identical to CaSi2. Half of the F atoms at the interface are missing; there is no F-Si bonding and the interface is charge neutral. The structure we find has not been considered previously and provides a natural explanation for the results of published photoemission studies. © 1988 The American Physical Society.
M. Copel, R.J. Culbertson, et al.
Applied Physics Letters
R.M. Tromp
ICPS Physics of Semiconductors 1984
J. Appenzeller, J. Knoch, et al.
IEDM 2006
R.M. Tromp, A.W. Denier Van Der Gon, et al.
Physical Review Letters