William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
In a series of experiments involving IR spectroscopy, Raman spectroscopy, scanning tunneling microscopy and measurements of the near-edge X-ray fine structure, many new details of the structure of Langmuir-Blodgett films have been obtained. The methods and the results giving orientation of the chains, their packing and the head group attachment are described, as well as other properties such as phase transitions. © 1987.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Ronald Troutman
Synthetic Metals