A. Gangulee, F.M. D'Heurle
Thin Solid Films
We have measured 4f core-level shifts and surface-to-bulk intensity ratios for surface atoms on the Au(111), (100) and (110) faces. These shifts show crystallographic dependences as well as dependences on surface reconstruction. For the reconstructed Au(110)-(2x1) surface, our data are consistent with a relaxed missing row model and exclude an unrelaxed missing row model. The Au(100)-(5x20) reconstructed surface gives surface core-level shifts and intensity ratios which are consistent with a buckled hexagonal overlayer model with surface relaxation. © 1981.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
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Microelectronic Engineering
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990