Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
A structure analysis of the Si(111)2 1 surface is performed using extensive new low-energy electron-diffraction data (12 beams). Although the -bonded chain model in its original form shows gross disagreement with low-energy electron diffraction, a modification of that structure gives moderate agreement. The major modifications are a buckling in the outer chain and an overall compression. © 1984 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
R. Ghez, J.S. Lew
Journal of Crystal Growth
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Frank Stem
C R C Critical Reviews in Solid State Sciences