Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Using high-resolution transmission electron microscopy the observation of two different metastable structures at a Σ = 5/[001]53·1° (210) symmetrical tilt boundary are reported upon. A structural unit approach is used to describe the differences between these structures. The results are consistent with computer simulation studies where a small difference in minimum energy states was previously reported. © 1991 Taylor & Francis Group, LLC.
T.N. Morgan
Semiconductor Science and Technology
John G. Long, Peter C. Searson, et al.
JES
P. Alnot, D.J. Auerbach, et al.
Surface Science
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP