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PaperDelamination from edge flawsM.D. Thouless, H.M. Jensen, et al.Proceedings of the Royal Society A
PaperGrain-size effects in the indentation fracture of MgOR.F. Cook, E. LinigerJournal of Materials Science
PaperPorous organosilicates for on-chip dielectric applicationsR.D. Miller, R. Beyers, et al.MRS Spring Meeting 1999
