J. Tersoff, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Review
Step energies and roughening of strained layers
Abstract
A comment on the Letter by Y. H. Xie, et al., Phys. Rev. Lett. 73, 3006 (1994). The author so the Letter offer a Reply. © 1995 The American Physical Society.
Related
J. Tersoff, Y.H. Phang, et al.
Physical Review Letters
F. Legoues, J. Tersoff, et al.
Applied Physics Letters
J.F. Morar, P.E. Batson, et al.
Physical Review B