Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
This paper discusses problems associated with defining normal forms of relational tables relevant to statistical processing. The concepts of derived identifier, class identifier, derived class-counts, count domains, compact and uniform domains for statistical relational tables have been introduced. We also discuss the structures of the first and the second statistical-normal forms and the relational decompositions needed to achieve them. The statistical-normal form can be an important method to determine whether the usual statistical analysis techniques are valid. We have some suggestions for extending the SQL statements to achieve these operations on statistical relational tables. Some results linking Codd'S normal forms with statistical normal forms are also discussed. We also discuss relational statistical abnormalities, called outlyers. © 1991 IEEE
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum
Thomas R. Puzak, A. Hartstein, et al.
CF 2007
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011