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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Review
Spectroscopy with the scanning tunnelling microscope: A critical review
Abstract
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
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