Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Frank Stem
C R C Critical Reviews in Solid State Sciences
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME