S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
J.A. Barker, D. Henderson, et al.
Molecular Physics
Sung Ho Kim, Oun-Ho Park, et al.
Small
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting