Sung Ho Kim, Oun-Ho Park, et al.
Small
Electromigration theories have brought increasing recognition that lattice inhomogeneities in metals produce spatial variations in current flow and in the associated transport field. It is shown, through a semiclassical one-dimensional model, that the spatial variations of carrier density near a lattice defect can produce strong local variations in the field required for current flow. This particular source of field inhomogeneity does not seem to have been recognized in earlier discussions.