Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
The error detection and correction capability of the IBM POWER6™ processor enables high tolerance to single-event upsets. The soft-error resilience was tested with proton beam- and neutron beam-induced fault injection. Additionally, statistical fault injection was performed on a hardware-emulated POWER6 processor simulation model. The error resiliency is described in terms of the proportion of latch upset events that result in vanished errors, corrected errors, checkstops, and incorrect architected states. © Copyright 2008 by International Business Machines Corporation.
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Charles H. Bennett, Aram W. Harrow, et al.
IEEE Trans. Inf. Theory
Daniel M. Bikel, Vittorio Castelli
ACL 2008
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009