Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
A conceptually simple approach is proposed to introduce dissipation into a normal-metal loop penetrated by a flux. The loop is coupled via a single current lead to an electron reservoir. Scattering processes in the loop are elastic. Inelastic processes occur only in the reservoir and are the source of dissipation. We investigate the effect of this reservoir on the persistent currents in the loop and the adsorption of power in the presence of a sinusoidally modulated flux. © 1985 The American Physical Society.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
A. Reisman, M. Berkenblit, et al.
JES
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999