R.F.C. Farrow, R.F. Marks, et al.
Journal of Applied Physics
The exchange field Hex transferred from a thick antiferromagnetic substrate to a thin exchange coupled ferromagnetic film is shown to reach a limiting value no matter how large the exchange coupling is. The limit is due to domain-wall formation in the antiferromagnet. Numerical results based on a simple model for the interface are presented and compared to experimental results.
R.F.C. Farrow, R.F. Marks, et al.
Journal of Applied Physics
D. Mauri, V.S. Speriosu, et al.
IEEE Transactions on Magnetics
P.S. Bagus, C.J. Nelin, et al.
JVSTA
Gianfranco Pacchioni, P.S. Bagus
Surface Science