P. Alnot, D.J. Auerbach, et al.
Surface Science
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
P. Alnot, D.J. Auerbach, et al.
Surface Science
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ADMETA 2011
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