Conference paper
High-sensitivity silicide films for optical recording
K.Y. Ahn, T.H. Distefano, et al.
CLEO 1982
We demonstrate here that bilayer films consisting of Si and transition metals with a layer thickness of 15-40 nm are promising materials for archival optical storage. They show a large optical reflectivity change before and after silicide formation, have a long lifetime at room temperature, and are nontoxic.
K.Y. Ahn, T.H. Distefano, et al.
CLEO 1982
F. Nava, K.N. Tu, et al.
Materials Science Reports
S.R. Herd
Journal of Applied Physics
D.S. Yee, J. Floro, et al.
JVSTA