U. Köster, D.R. Campbell, et al.
Thin Solid Films
We demonstrate here that bilayer films consisting of Si and transition metals with a layer thickness of 15-40 nm are promising materials for archival optical storage. They show a large optical reflectivity change before and after silicide formation, have a long lifetime at room temperature, and are nontoxic.
U. Köster, D.R. Campbell, et al.
Thin Solid Films
P.A. Psaras, M. Eizenberg, et al.
Journal of Applied Physics
Jian Li, J.W. Mayer, et al.
Physical Review B
G. Ottaviani, K.N. Tu, et al.
Applied Physics Letters