H.K. Liou, X. Wu, et al.
Applied Physics Letters
We demonstrate here that bilayer films consisting of Si and transition metals with a layer thickness of 15-40 nm are promising materials for archival optical storage. They show a large optical reflectivity change before and after silicide formation, have a long lifetime at room temperature, and are nontoxic.
H.K. Liou, X. Wu, et al.
Applied Physics Letters
P. Chaudhari, S.R. Herd
Journal of Non-Crystalline Solids
O. Bisi, L.W. Chiao, et al.
Physical Review B
K.N. Tu
Materials Letters