Conference paper
VLSI-NEMS chip for AFM data storage
M. Despont, J. Brugger, et al.
MEMS 1999
An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures. It will become evident that the technique is likewise applicable to chemical investigations of surfaces on an atomic scale. © 1984 Elsevier Science Publishers B.V.
M. Despont, J. Brugger, et al.
MEMS 1999
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
F. Ohnesorge, W.M. Heckl, et al.
Ultramicroscopy
H. Rohrer
Il Nuovo Cimento A Series 11