A.M. Begley, S.K. Kim, et al.
Physical Review B
Paper
Sample holder for diffraction and other studies in ultrahigh vacuum
Abstract
A sample holder suitable for ultrahigh vacuum experimentation is described that allows, in addition to translation and tilting, rotation of the sample around two mutually perpendicular axes. © 1969 The American Institute of Physics.
Related
R.F. Peart, F. Jona, et al.
Journal of Applied Physics
F. Jona, P.M. Marcus
Surface Science
R.F. Lin, Y.S. Li, et al.
Physical Review B