D.D. Awschalom, J.M. Hong, et al.
Physical Review Letters
Paper
Roughening and lower critical dimension in the random-field ising model
Abstract
It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.
Related
Matthew P. A. Fisher, Peter B. Weichman, et al.
Physical Review B
G.A. Held, I. Dierking, et al.
EURODISPLAY 1997
G. Grinstein, M.A. Muñoz, et al.
Physical Review Letters