J.E.S. Socolar, G. Grinstein, et al.
Physical Review E
Paper
Roughening and lower critical dimension in the random-field ising model
Abstract
It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.
Related
G. Grinstein, John Toner
Physical Review Letters
J. Tersoff, Yuhai Tu, et al.
Applied Physics Letters
G. Grinstein, C. Jayaprakash, et al.
Physica D: Nonlinear Phenomena