PaperLaser interferometric thermometry for substrate temperature measurementKatherine L. Saenger, Julie GuptaApplied Optics
PaperLaser interferometric measurement of polymer thin film thickness changes during processingKatherine L. Saenger, Ho‐Ming TongJournal of Applied Polymer Science
PaperEffect of TiOX nucleation layer on crystallization of Bi4Ti3O12 filmsDeborah A. Neumayer, Peter R. Duncombe, et al.Integrated Ferroelectrics
Conference paperA selective etching process for chemically inert high-k metal oxidesKatherine L. Saenger, Harald F. Okorn-Schmidt, et al.MRS Proceedings 2002