A Multiscale Workflow for Thermal Analysis of 3DI Chip Stacks
Max Bloomfield, Amogh Wasti, et al.
ITherm 2025
Silent data corruption (SDC) is a term that has created a specter of doubt and fear amongst the information community in recent years. A special issue of IEEE Micro on SDC is about to appear, and in that theme issue, a position paper has been accepted for publication[1]. In that paper, we focus our attention on the problem of power management and the need for vigilance in ensuring SDC-free functionality in future power-constrained processor systems. In this workshop paper, we provide an experience-based report on how to stress-test and characterize an aggressively power-managed processor (in both pre- and post-silicon settings) in order to ensure robust functionality.
[1] P. Bose, R. Bertran, A. Buyuktosunoglu, H. Jacobson, K. Swaminathan, M. Pflanz, C. F. Webb, T. Webel, C. Jacobi, "Robust Power Management: A Key Aspect of SDC-free Systems," inIEEE Micro, doi: 10.1109/MM.2025.3644998 (to appear in the special issue on SDC).
Max Bloomfield, Amogh Wasti, et al.
ITherm 2025
Evaline Ju, Kelly Abuelsaad
KubeCon EU 2026
Pradip Bose, Jennifer Dworak, et al.
HPCA 2026
Zhigang Hu, Alper Buyuktosunoglu, et al.
ISLPED 2004