E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Wide-angle X-ray diffraction (WAXD), small-angle light, light scattering and birefringence were used to investigate the temperature dependence of the morphology of poly[bis(trifluoroethoxy)phosphazene]. Experiments conducted on solution cast films revealed a spherulitic morphology in the range 25-225 °C. Structural changes, associated with the transformation to the mesomorphic state, were found to occur in the temperature range 70-90 °C. Above the melting point, the material was isotropic by optical techniques and amorphous by WAXD. The results are discussed in terms of changes in molecular ordering. © 1984, American Chemical Society. All rights reserved.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
K.A. Chao
Physical Review B
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings