J. Lohau, A. Moser, et al.
Applied Physics Letters
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Resonant soft x-ray scattering from magnetic thin films
Abstract
We have applied resonant SAS to characterize the chemical and magnetic heterogeneity of Co-based multilayers as well as CoPtCr-based perpendicular and longitudinal media. Separation of the chemical vs. magnetic heterogeneity is achieved by tuning the x-ray energy to both the Co and Cr edges.
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