William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
J.Z. Sun
Journal of Applied Physics
E. Burstein
Ferroelectrics
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008