J.F. Janak, A.R. Williams, et al.
Physical Review B
Data on resistivity at room temperature in polycrystalline and single-crystal Permalloy (80 Ni-20 Fe) thin films are analyzed in terms of grain boundary scattering and the dc size effect, respectively. © 1974 American Institute of Physics.
J.F. Janak, A.R. Williams, et al.
Physical Review B
J.F. Janak
Solid State Communications
P. Chaudhari, A. Gangulee
Scripta Metallurgica
A. Gangulee, F.M. D'Heurle
Thin Solid Films